efficient way to process data

[Larry Martell]

On Tue, Jan 14, 2014 at 7:26 AM, Chris Angelico <rosuav at gmail.com> wrote:
> On Wed, Jan 15, 2014 at 1:18 AM, Larry Martell <larry.martell at gmail.com> wrote:
>> if you're interested in what the application is, this is data
>> collected with an electron microscope from semiconductor wafers as
>> they are being manufactured. The x and y are the position on the wafer
>> that the data was collected, in microns. If 2 data points are
>> collected within 1 micron of each other they need to be combined when
>> being analyzed.
>
> As far as I'm concerned, you won geek cred the moment you said
> "electron microscope", and "semiconductor wafers as they are being
> manufactured" is just gravy.

Thanks! You made my day. I showed this to my wife and she asked "Is that good?"

> Do you actually mean here that the two points need to be within 1
> micron, or that data gets combined if it's nearby in *either*
> coordinate?

Either coordinate.